Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.
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ASTM E – 02() Standard Test Methods for Characterizing Duplex Grain Sizes
The Measuring and Referee Procedures are more difficult to apply, but offer f1181 accuracy. An example of a complete report might read: Make at least 10 measurements at different locations of the depth of a given surface layer, and calculate the average depth from those measurements.
An example photomicrograph of the necklace e181 appears in Fig. An example photomicrograph of the ALA condition appears in Fig. All controls necessary for measurement are found on the easy to use control panel shown here.
ASTM E1181 – 02(2015)
However, these steels may also exhibit a bimodal grain size condition solely within the ferrite grain structure. These data ee1181 be used to assess the nature of the observed grain size distribution, and to determine mean intercept lengths and area fractions for distinct segments of a total distribution. The software provides fast and accurate detection of asstm boundaries or grain face areas. Further suppose that measurements indicate an average depth of that surface layer of 1.
This procedure can be carried out astk more efficiently through the use of an automated image analysis system with an electronic pencil or cursor, or through the use of a semi-automated image analysis system with a digitizing tablet and electronic pencil or cursor.
Use of the grid is described in Methods E On the overlay, also mark the outline of the total eld of view the limits of the image.
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Compare such gures with eyepiece or projected images from a microscope, or with photomicrographs. Measures grain boundary intercept distances or individual grain areas. For all other products, area fraction estimates should be equally accurate with either specimen orientation.
Examples of topological duplex grain sizes include: Etch specimens so that all grain boundaries are distinct and easily visible. This value was then entered in the eighth column. Then use the planimeter to measure the area enclosed within each outlined region.
Results will be incorporated here when available. It is the responsibility of the user of this standard to consult appropriate safety and health practices and determine the applicability of regulatory limitations prior to its use. If duplex grain size is suspected in a product too large to be polished and etched as a single specimen, macroetching should be considered as a first step in evaluation.
The test grid consists of a square network of grid lines, ashm a recommended interline spacing of 5 mm. For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen. Your comments will receive careful consideration at a meeting of the responsible technical committee, which you may attend. The values from this calculation were entered in the seventh column of Table Ashm.
This standard does not purport to address all of the safety concerns associated with its use. An arbitrary division was made between the two distinct distributions of grain sizes. The grain size and area fraction astn shown in a given report format correspond to the appearance of the photomicrograph shown.
Your comments are invited either for revision of this standard or for additional standards and should be addressed to ASTM International Headquarters. If duplex grain size is suspected in a product too large to be polished and etched as a single s1181, macroetching should be considered as a rst step in evaluation.
If this is not practical, apply the estimation procedure to as much of the specimen as is reasonable, but recognize that, by not sampling all of the specimen area, some e1181 bias may be introduced into the estimate.
These are available from microscope manufacturers. The most precise estimate of the area fractions occupied by each grain size will be obtained by evaluating the entire surface of that specimen. Presentation of the data as a histogram or a frequency plot is also shown.
Use this average and the astn product dimensions to calculate an estimated area fraction for that surface layer.